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MRC | Criteria | Characteristic |
---|---|---|
AAQL | BODY STYLE | CHIP TYPE |
AARG | RELIABILITY INDICATOR | NOT ESTABLISHED |
ABJT | TERMINAL LENGTH | 0.020 INCHES NOMINAL |
ADAQ | BODY LENGTH | 0.126 INCHES NOMINAL |
ADAT | BODY WIDTH | 0.063 INCHES NOMINAL |
ADAU | BODY HEIGHT | 0.059 INCHES NOMINAL |
AEBZ | SCHEMATIC DIAGRAM DESIGNATOR | NO COMMON OR GROUNDED ELECTRODE(S) |
CQBF | INSULATION RESISTANCE AT MAXIMUM OPERATING TEMP | 10000.0 MEGOHMS |
CQBQ | CAPACITANCE VALUE PER SECTION | 100000.000 PICOFARADS SINGLE SECTION |
CQFB | VOLTAGE TEMP LIMITS PER SECTION IN PERCENT CAPACITANCE CHANGE | -15.0/+15.0 WITHOUT VOLTAGE APPLIED SINGLE SECTION |
CQJJ | NONDERATED OPERATING TEMP | -55.0 DEG CELSIUS MINIMUM AND 125.0 DEG CELSIUS MAXIMUM |
CQWM | NONDERATED CONTINUOUS VOLTAGE RATING AND TYPE PER SECTION | 50.0 DC SINGLE SECTION |
CRTP | TOLERANCE RANGE PER SECTION | -10.00/+10.00 PERCENT SINGLE SECTION |
CWJK | CASE MATERIAL | CERAMIC |
PMLC | PRECIOUS MATERIAL AND LOCATION | TERMINAL SURFACES SILVER |
CWPM | DISSIPATION FACTOR AT REFERENCE TEMP IN PERCENT | 2.500 |
CWSG | TERMINAL SURFACE TREATMENT | SILVER |
TTQY | TERMINAL TYPE AND QUANTITY | 2 BONDING PAD |
CWPK | INSULATION RESISTANCE AT REFERENCE TEMP | 100000.0 MEGOHMS |
11C-7-37 | 11C-L | 11C00002 | 11C0014 |
11C-50-3-4 | 11C-1750-15A4NM AS | 11C00002 | 11C-50-3-4 |
11C-7-30 | 11C-8-37 | 11C0060 | 11C0063 |
11C-9-54 | 11C-8-50 | 11C0014 | 11C-020028 |
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