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MRC | Criteria | Characteristic |
---|---|---|
ABBH | INCLOSURE MATERIAL | METAL |
ABHP | OVERALL LENGTH | 0.450 INCHES MAXIMUM |
ADAV | OVERALL DIAMETER | 0.667 INCHES MAXIMUM |
AKPV | MOUNTING FACILITY QUANTITY | 1 |
ALAZ | JOINT ELECTRONIC DEVICE ENGINEERING COUNCIL/JEDEC/CASE OUTLINE DESIGNATION | DO-5 |
AXGY | MOUNTING METHOD | THREADED STUD |
CBBL | FEATURES PROVIDED | HERMETICALLY SEALED CASE |
CCDG | OVERALL WIDTH ACROSS FLATS | 0.667 INCHES MINIMUM AND 0.687 INCHES MAXIMUM |
CQJX | NOMINAL THREAD SIZE | 0.250 INCHES |
CTMZ | SEMICONDUCTOR MATERIAL | SILICON |
CTQN | VOLTAGE RATING IN VOLTS PER CHARACTERISTIC | 150.0 MAXIMUM REVERSE VOLTAGE, PEAK |
CTQX | CURRENT RATING PER CHARACTERISTIC | 500.00 AMPERES MAXIMUM AVERAGE FORWARD CURRENT AVERAGED OVER A FULL 60-HZ CYCLE |
CTSG | MAXIMUM OPERATING TEMP PER MEASUREMENT POINT | 200.0 DEG CELSIUS JUNCTION |
THSD | THREAD SERIES DESIGNATOR | UNF |
TTQY | TERMINAL TYPE AND QUANTITY | 1 THREADED STUD AND 1 TAB, SOLDER LUG |
ZZZK | SPECIFICATION/STANDARD DATA | 80131-RELEASE2637 PROFESSIONAL/INDUSTRIAL ASSOCIATION SPECIFICATION |
1N1-1C-AZ | 1N1-1D-ZZ | 1N1-1D-ZZ | 1N1-2B-ZZ |
1N1-1A-DZ | 1N1-1E-CZ | 1N1-1E-EZ | 1N1-3N-CZ |
1N1-1E-HZ | 1N1-1C-CZ | 1N1-3Q-ZZ | 1N1-2B-ZZ |
1N1-3N-BZ | 1N1-1G-ZZ | 1N1-1E-AZ | 1N1-1A-DZ |
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