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MRC | Criteria | Characteristic |
---|---|---|
AFJQ | STORAGE TEMP RANGE | -65.0 TO 150.0 DEG CELSIUS |
CSSL | DESIGN FUNCTION AND QUANTITY | 2 FLIP-FLOP, D-TYPE |
CQZP | INPUT CIRCUIT PATTERN | DUAL 4 INPUT |
ADAT | BODY WIDTH | 0.220 INCHES MINIMUM AND 0.280 INCHES MAXIMUM |
CZEQ | TIME RATING PER CHACTERISTIC | 25.00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME, LOW TO HIGH LEVEL OUTPUT AND 40.00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME, HIGH TO LOW LEVEL OUTPUT |
CBBL | FEATURES PROVIDED | HERMETICALLY SEALED AND MONOLITHIC AND EDGE TRIGGERED AND W/CLEAR AND W/PRESET |
CQSJ | INCLOSURE MATERIAL | CERAMIC AND GLASS |
CQSZ | INCLOSURE CONFIGURATION | DUAL-IN-LINE |
ADAU | BODY HEIGHT | 0.140 INCHES MINIMUM AND 0.180 INCHES MAXIMUM |
ADAQ | BODY LENGTH | 0.660 INCHES MINIMUM AND 0.785 INCHES MAXIMUM |
CTFT | CASE OUTLINE SOURCE AND DESIGNATOR | T0-116 JOINT ELECTRON DEVICE ENGINEERING COUNCIL |
TEST | TEST DATA DOCUMENT | 80063-SM-A-699713 DRAWING (THIS IS THE BASIC GOVERNING DRAWING, SUCH AS A CONTRACTOR DRAWING, ORIGINAL EQUIPMENT MANUFACTURER DRAWING, ETC.; EXCLUDES ANY SPECIFICATION, STANDARD OR OTHER DOCUMENT THAT MAY BE REFERENCED IN A BASIC GOVERNING DRAWING) |
CQWX | OUTPUT LOGIC FORM | TRANSISTOR-TRANSISTOR LOGIC |
AFGA | OPERATING TEMP RANGE | -55.0 TO 125.0 DEG CELSIUS |
54S-1032 | 54S-3R1P-1002-MODIFIED | 54S-3R1P-1002-MODIFIED | 54S 140 DMQC |
54S-1035 | 54S-5H4P-1010 | 54S 140 DMQC | 54S00 BCA |
54S-1035 | 54S0-14 | 54S-1035 | 54S0-14 |
54S00 BCA | 54S-1035 | 54S-3RIP-1001 | 54S00 883B |
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