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NSN | FSC | NIIN | CLS | Hazmat | DEMIL | Cancelled NSN |
---|---|---|---|---|---|---|
5962-01-392-2821 Item Description: Microcircuit Memory | 5962 | 013922821 | 0 | N | D | |
CIIC | HCC | ESD | PMIC | Criticality | ENAC | |
7 | D | A | 0 | |||
Part Number | ISC | RNVC | RNCC | HCC | MSDS | SADC |
Rom Prom Family 048 | 5 | 1 | 5 |
MRC | Criteria | Characteristic |
---|---|---|
TEST | TEST DATA DOCUMENT | 96906-MIL-STD-883 STANDARD (INCLUDES INDUSTRY OR ASSOCIATION STANDARDS, INDIVIDUAL MANUFACTUREER STANDARDS, ETC.). |
CQSZ | INCLOSURE CONFIGURATION | DUAL-IN-LINE |
CBBL | FEATURES PROVIDED | HERMETICALLY SEALED AND PROGRAMMED |
CWSG | TERMINAL SURFACE TREATMENT | SOLDER |
CZEN | VOLTAGE RATING AND TYPE PER CHARACTERISTIC | 12.0 VOLTS MAXIMUM POWER SOURCE |
AFGA | OPERATING TEMP RANGE | -55.0 TO 125.0 DEG CELSIUS |
TTQY | TERMINAL TYPE AND QUANTITY | 20 PRINTED CIRCUIT |
CTFT | CASE OUTLINE SOURCE AND DESIGNATOR | D-8 MIL-M-38510 |
CQSJ | INCLOSURE MATERIAL | CERAMIC |
CQWX | OUTPUT LOGIC FORM | TRANSISTOR-TRANSISTOR LOGIC |
CZEQ | TIME RATING PER CHACTERISTIC | 45.00 NANOSECONDS MAXIMUM ACCESS |
CZER | MEMORY DEVICE TYPE | PAL |
ROM PROM 005 | ROM PROM 020 | ROM PROM FAAMILY 042 | ROM PROM 016 |
ROM 497 | ROM PROM 020 | ROM PROM 013 | ROM PROM 020 |
ROM-2244S-NF-R | ROM 497 | ROM PROM 016 | ROM-8 |
ROM PROM 016 | ROM PROM 008 | ROM PROM 013 | ROM-2244S |
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