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NSN | FSC | NIIN | CLS | Hazmat | DEMIL | Cancelled NSN |
---|---|---|---|---|---|---|
5961-00-082-3571 Item Description: Semiconductor Devic | 5961 | 000823571 | 0 | N | A | |
CIIC | HCC | ESD | PMIC | Criticality | ENAC | |
U | A | G | 0 | |||
Part Number | ISC | RNVC | RNCC | HCC | MSDS | SADC |
Jan1n21wem | 1 | 9 | 5 |
MRC | Criteria | Characteristic |
---|---|---|
ABBH | INCLOSURE MATERIAL | CERAMIC ALL SEMICONDUCTOR DEVICE DIODE |
ABHP | OVERALL LENGTH | 0.800 INCHES MINIMUM ALL SEMICONDUCTOR DEVICE DIODE AND 0.840 INCHES MAXIMUM ALL SEMICONDUCTOR DEVICE DIODE |
ADAV | OVERALL DIAMETER | 0.292 INCHES MINIMUM ALL SEMICONDUCTOR DEVICE DIODE AND 0.296 INCHES MAXIMUM ALL SEMICONDUCTOR DEVICE DIODE |
AFZC | FUNCTION FOR WHICH DESIGNED | MIXER |
ASDD | COMPONENT FUNCTION RELATIONSHIP | MATCHED |
ASKA | COMPONENT NAME AND QUANTITY | 2 SEMICONDUCTOR DEVICE DIODE |
AXGY | MOUNTING METHOD | TERMINAL ALL SEMICONDUCTOR DEVICE DIODE |
CBBL | FEATURES PROVIDED | HERMETICALLY SEALED CASE |
CTMZ | SEMICONDUCTOR MATERIAL | SILICON ALL SEMICONDUCTOR DEVICE DIODE |
CTQN | VOLTAGE RATING IN VOLTS PER CHARACTERISTIC | 75.0 MAXIMUM BREAKDOWN VOLTAGE, COLLECTOR-TO-EMITTER, BASE OPEN |
CTSG | MAXIMUM OPERATING TEMP PER MEASUREMENT POINT | 150.0 DEG CELSIUS AMBIENT AIR ALL SEMICONDUCTOR DEVICE DIODE |
PMLC | PRECIOUS MATERIAL AND LOCATION | BODY SURFACE GOLD |
PRMT | III PRECIOUS MATERIAL | GOLD |
TEST | TEST DATA DOCUMENT | 81349-MIL-S-19500 SPECIFICATION (INCLUDES ENGINEERING TYPE BULLETINS, BROCHURES,ETC., THAT REFLECT SPECIFICATION TYPE DATA IN SPECIFICATION FORMAT; EXCLUDES COMMERCIAL CATALOGS, INDUSTRY DIRECTORIES, AND SIMILAR TRADE PUBLICATIONS, REFLECTI |
TTQY | TERMINAL TYPE AND QUANTITY | 2 PIN ALL SEMICONDUCTOR DEVICE DIODE |
ZZZK | SPECIFICATION/STANDARD DATA | 81349-MIL-S-19500/232 GOVERNMENT SPECIFICATION |
JAN 1N 4005 | Jan-00 | JAN-1N1126A | JAN 1N 4005 |
JAN-1N6471 | JAN 2N174 | JAN 1N 4005 | JAN 1N1188 |
JAN-0512 | JAN 1N4944 | JAN-1N1188 | JAN-2E26 |
JAN-1N540 | JAN 1N4944 | JAN-1N254 | JAN-1N1188 |
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