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NSN | FSC | NIIN | CLS | Hazmat | DEMIL | Cancelled NSN |
---|---|---|---|---|---|---|
5961-01-206-4137 Item Description: Semiconductor Devic | 5961 | 012064137 | 0 | N | B | |
CIIC | HCC | ESD | PMIC | Criticality | ENAC | |
U | B | A | 0 | |||
Part Number | ISC | RNVC | RNCC | HCC | MSDS | SADC |
Dd1137 | 5 | 2 | 5 |
MRC | Criteria | Characteristic |
---|---|---|
ABBH | INCLOSURE MATERIAL | CERAMIC ALL SEMICONDUCTOR DEVICE DIODE AND METAL ALL SEMICONDUCTOR DEVICE DIODE |
ABHP | OVERALL LENGTH | 1.000 INCHES NOMINAL ALL SEMICONDUCTOR DEVICE DIODE |
ADAV | OVERALL DIAMETER | 0.620 INCHES NOMINAL ALL SEMICONDUCTOR DEVICE DIODE |
AKPV | MOUNTING FACILITY QUANTITY | 1 ALL SEMICONDUCTOR DEVICE DIODE |
ASDD | COMPONENT FUNCTION RELATIONSHIP | MATCHED |
ASKA | COMPONENT NAME AND QUANTITY | 2 SEMICONDUCTOR DEVICE DIODE |
AXGY | MOUNTING METHOD | THREADED STUD ALL SEMICONDUCTOR DEVICE DIODE |
CTMZ | SEMICONDUCTOR MATERIAL | SILICON ALL SEMICONDUCTOR DEVICE DIODE |
CTQN | VOLTAGE RATING IN VOLTS PER CHARACTERISTIC | 1.0 MAXIMUM FORWARD VOLTAGE, DC ALL SEMICONDUCTOR DEVICE DIODE |
CTRG | CAPACITANCE RATING IN PICOFARADS | 0.23 MINIMUM ALL SEMICONDUCTOR DEVICE DIODE AND 0.27 MAXIMUM ALL SEMICONDUCTOR DEVICE DIODE |
CTSG | MAXIMUM OPERATING TEMP PER MEASUREMENT POINT | 150.0 DEG CELSIUS AMBIENT AIR ALL SEMICONDUCTOR DEVICE DIODE |
TEST | TEST DATA DOCUMENT | 53711-6116243 SPECIFICATION (INCLUDES ENGINEERING TYPE BULLETINS, BROCHURES,ETC., THAT REFLECT SPECIFICATION TYPE DATA IN SPECIFICATION FORMAT; EXCLUDES COMMERCIAL CATALOGS, INDUSTRY DIRECTORIES, AND SIMILAR TRADE PUBLICATIONS, REFLECTING G |
TTQY | TERMINAL TYPE AND QUANTITY | 1 CASE ALL SEMICONDUCTOR DEVICE DIODE AND 1 THREADED STUD ALL SEMICONDUCTOR DEVICE DIODE |
DD1-R030HA1 | DD1-5 | DD1-8 | DD10 |
DD1-50 | DD100 | DD1-R030JA7 | DD1-00 |
DD100 | DD1-B0-34-610-1G2-C | DD1-B030HA1DD1 | DD1-B030VA1DD1 |
DD1-0 | DD100 | DD100 | DD1 00 |
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