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| NSN | FSC | NIIN | CLS | Hazmat | DEMIL | Cancelled NSN |
|---|---|---|---|---|---|---|
| 5962-01-518-3613 Item Description: MICROCIRCUIT,MEMORY | 5962 | 015183613 | 0 | N | B | |
| CIIC | HCC | ESD | PMIC | Criticality | ENAC | |
| 7 | B | A | 0 | |||
| Part Number | ISC | RNVC | RNCC | HCC | MSDS | SADC |
| 89954-356A1409P32 | 5 | 9 | 5 |
| MRC | Criteria | Characteristic |
|---|---|---|
| CQSZ | INCLOSURE CONFIGURATION | LEADED CHIP CARRIER |
| CBBL | FEATURES PROVIDED | ELECTROSTATIC SENSITIVE AND ELECTRICALLY ALTERABLE |
| CZEP | CAPITANCE RATING PER CHARACTERISTIC | 10.00 INPUT PICOFARADS MAXIMUM AND 10.00 OUTPUT PICOFARADS MAXIMUM |
| TEST | TEST DATA DOCUMENT | 89954-356A1407 DRAWING (THIS IS THE BASIC GOVERNING DRAWING, SUCH AS A CONTRACTOR DRAWING, ORIGINAL EQUIPMENT MANUFACTURER DRAWING, ETC.; EXCLUDES ANY SPECIFICATION, STANDARD OR OTHER DOCUMENT THAT MAY BE REFERENCED IN A BASIC GOVERNING DRAWING) |
| ADAQ | BODY LENGTH | 27.9 MILLIMETERS MINIMUM AND 28.1 MILLIMETERS MAXIMUM |
| AFGA | OPERATING TEMP RANGE | -55.0 TO 125.0 DEG CELSIUS |
| ADAT | BODY WIDTH | 27.9 MILLIMETERS MINIMUM AND 28.1 MILLIMETERS MAXIMUM |
| FEAT | SPECIAL FEATURES | 5000 GATES, EEPROM-BASED |
| CQWX | OUTPUT LOGIC FORM | COMPLEMENTARY-METAL OXIDE-SEMICONDUCTOR LOGIC |
| CXCY | PART NAME ASSIGNED BY CONTROLLING AGENCY | MICROCIRCUIT, PROGRAMABLE LOGIC DEVICE, MAX 7000 SERIES, PLASTIC ENCAPSULATED (SURFACE MOUNT) |
| ADAU | BODY HEIGHT | 3.2 MILLIMETERS MINIMUM AND 3.6 MILLIMETERS MAXIMUM |
| AFJQ | STORAGE TEMP RANGE | -65.0 TO 150.0 DEG CELSIUS |
| TTQY | TERMINAL TYPE AND QUANTITY | 208 GULLWING |
| CZEN | VOLTAGE RATING AND TYPE PER CHARACTERISTIC | 4.5 VOLTS MINIMUM POWER SOURCE AND 5.2 VOLTS MAXIMUM POWER SOURCE |
| AGAV | III END ITEM IDENTIFICATION | C-17A AIRCRAFT |
| CQSJ | INCLOSURE MATERIAL | PLASTIC |
| CRTL | CRITICALITY CODE JUSTIFICATION | CBBL |
| CZEQ | TIME RATING PER CHACTERISTIC | 7.50 NANOSECONDS MAXIMUM PROPAGATION DELAY |
| SPCL | SPECIAL TEST FEATURES | UPSCREENING TESTING CONSISTING OF EXTENDED TEMPERATURE RANGE TESTING |
| CZER | MEMORY DEVICE TYPE | PAL |
| 899-06 | 899-00107-000 | 899-00106-000 | 899-000-00000 |
| 899-070002 | 899-00127-000 | 899-0011 | 899-04 |
| 899-01A | 899-070006 | 899-06W | 899 01B |
| 899-0320-001 | 899-070008 | 899-01A-DWG REF P | 899-0011 |
 |
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